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Beilstein J. Nanotechnol. 2017, 8, 434–439, doi:10.3762/bjnano.8.46
Figure 1: Scheme of the sputtering process with glancing angle deposition and rotating substrate.
Figure 2: (a) Photograph, (b) AFM images, and (c) SEM images (upper row: top view, lower row: fracture cross ...
Figure 3: (a) Diameter distribution obtained from top-view SEM images for the Au samples prepared onto Si sub...
Figure 4: Reflectance spectra of nanostructured Au samples exhibiting black color (a) and golden color (b). F...
Figure 5: (a) Photograph of two samples prepared onto MgO substrates: a continuous Au thin film prepared with...